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Applying the
Field Emission
Orthodoxy Test
to Murphy-Good
Plots
M. M. Allahama,
R. G. Forbesb
and M. S.
Mousaa*
a
Surface Physics
and Materials
Technology Lab.,
Department of
Physics, Mutah
University, Al-Karak
61710, Jordan.
Email:
mmousa@mutah.edu.jo
b
Advanced
Technology
Institute &
Department of
Electrical and
Electronic Eng.,
Faculty of Eng.
& Physical
Sciences,
University of
Surrey,
Guildford,
Surrey GU2 7XH,
UK.
Doi :
https://doi.org/10.47011/13.2.2
Cited by :
Jordan J. Phys.,
13 (2) (2020)
101-111
PDF
Received
on:
10/10/2019;
Accepted
on:
16/1/2020
Abstract:
In field
electron
emission
(FE)
studies,
it is
important
to check
and
analyze
the
quality
and
validity
of
results
experimentally
obtained
from
samples,
using
suitably
plotted
current-voltage
[Im(Vm)]
measurements.
For the
traditional
plotting
method,
the
Fowler-Nordheim
(FN)
plot,
there
exists a
so-called
"orthodoxy
test"
that can
be
applied
to the
FN plot,
in order
to check
whether
or not
the FE
device/system
generating
the
results
is
"ideal".
If it is
not
ideal,
then
emitter
characterization
parameters
deduced
from the
FN plot
are
likely
to be
spurious.
A new
form of
FE Im(Vm)
data
plot,
the
so-called
"Murphy-Good
(MG)
plot",
has
recently
been
introduced
(R.G.
Forbes,
Roy.
Soc.
Open
Sci. 6
(2019)
190912).
This
aims to
improve
the
precision
with
which
characterization-parameter
values
(particularly
values
of
formal
emission
area)
can be
extracted
from FE
Im(Vm)
data.
The
present
paper
compares
this new
plotting
form
with the
older FN
and
Millikan-Lauritsen
(ML)
forms
and
makes an
independent
assessment
of the
consistency
with
which
slope
(and
hence
scaled-field)
estimates
can be
extracted
from an
MG plot.
It is
shown
that, by
using a
revised
formula
for the
extraction
of
scaled-field
values,
the
existing
orthodoxy
test can
be
applied
to
Murphy-Good
plots.
The
development
is
reported
of a
prototype
web tool
that can
apply
the
orthodoxy
test to
all
three
forms of
FE data
plot
(ML, MG
and FN).
Keywords:
Field
emission,
Field
electron
emission,
Murphy-Good
plot,
Fowler-Nordheim
plot,
Millikan-Lauritsen
plot,
Orthodoxy
test.
References
[1]
International
Standards
Organization
(ISO),
"International
Standard ISO
80000-1:2009
Quantities and
Units-Part 1:
General",
(Geneva, ISO,
2009). See
Section 6.
[2] Forbes,
R.G., Proc. R.
Soc. Lond. A,
469 (2013)
20130271.
[3] Fowler, R.H.
and Nordheim,
L., Proc. R.
Soc. Lond. A,
119 (1928) 173.
[4] Burgess, R.E.,
Kroemer, H. and
Houston, J.M.,
Phys. Rev., 90
(1953) 515.
[5] Nordheim,
L.W., Proc. R.
Soc. Lond. A,
121 (1928) 626.
[6] Murphy, E.L.
and Good, R.H.,
Phys. Rev., 102
(1956) 1464.
[7] Forbes,
R.G. and Deane,
J.H.B., Proc. R.
Soc. Lond. A,
463 (2007) 2907.
[8] Forbes,
R.G., R. Soc.
Open Sci., 6
(2019) 190912.
[9] Forbes,
R.G., Deane,
J.H.B., Fischer,
A. and Mousa,
M.S., Jordan J.
Phys., 8 (2015)
125.
[10] Mousa,
M.S., Al-Laham
M. and Forbes,
R.G., "Testing
of field
emission
orthodoxy by
using a simple
web
application",
4th
International
Symp. on
Dielectric
Materials and
Applications,
(Amman, Jordan,
May 2019),
[Abstracts, p.
76].
[11] (http://fieldemissionanalysis.weebly.com/).
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