|
Field Electron
Emission
Characteristics
of
Tungsten–Polyethylene
Composite
Material As a
Source of
Electron
Emission
Nizar A. Abu-Najma,
Moneeb T. M.
Shatnawia,
Mohammad M.
Allahamb,c
and Marwan S.
Mousad
a
Department of
Physics, The
University of
Jordan, Amman
11942, Jordan.
b
Institute of
Scientific
Instruments of
CAS,
Královopolská
147, 612 64
Brno, Czech
Republic.
c
Central European
Institute of
Technology, Brno
University of
Technology,
Purkyňova 123,
612 00 Brno,
Czech Republic.
d
Department of
Physics, Mu'tah
University, Al-Karak
61710, Jordan.
Corresponding
Author:
Marwan S. Mousa
Email:
mmousa@mutah.edu.jo
Doi :
https://doi.org/10.47011/15.5.11
Cited by :
Jordan J. Phys.,
15 (5) (2022)
537-545
PDF
Received
on:
12/08/2021;
Accepted
on:
07/10/2021
Abstract:
This
work
provides
an
experimental
study on
the
effects
of
polyethylene
coating
on the
field
electron
emission
characteristics
of clean
(uncoated)
tungsten
tips.
Several
tungsten
tips,
with
different
apex
radii,
have
been
prepared,
coated
with
different
thicknesses
of
polyethylene
layers
and then
examined
using a
standard
field
electron
emission
microscope.
Various
field
electron
emission
characteristics
have
been
measured
under
high-vacuum
conditions.
These
include
current-voltage
characteristics,
Fowler-Nordheim
plots,
scanning
electron
micrographs
and
spatial
current
distributions
(electron-emission
images).
Based on
this
work, it
is
proved
that
coating
tungsten
tips
with
polyethylene
layers
has
caused
dramatic
improvements
on the
tip
emission
properties.
In
particular,
coating
the tips
improves
the
current-voltage
characteristics,
which is
reflected
in
lowering
the
extraction
voltage,
getting
more
stable
emission
currents,
expressing
the
current-voltage
characteristics
using
Fowler-Nordheim
plots
and
finally,
the
spatial
distributions
of the
emitted
electrons
for the
coated
tips are
more
stable
and
uniform.
Keywords:
Field
electron
emitter,
Polyethylene
dielectric
layer,
Composite
emitter,
Field
electron
microscope,
Scanning
electron
microscope.
References
[1] Latham, R.V.
and Mousa, M.S.,
J. Phys. D:
Appl. Phys., 19
(1986) 699.
[2] Mousa, M.S.,
Surf. Interface
Anal., 39 (2007)
102.
[3] Fowler, R.H.
and Nordheim,
Dr.L., Proc. R.
Soc. A., 119
(781) (1928)
173.
[4] Forbes,
R.G.,
Nanotechnology,
23 (2012) 095706
(12 pp).
[5] Lea, C., J.
Phys.
D, 10
(1977) L195.
[6] Latham, R.V.
and Wilson,
D.A., J.
Phys. D, 14
(1981) 2139.
[7] Braun, E.,
Smith, J.F. and
Sykes, D.E.,
Vacuum, 25
(1975) 425.
[8] Mousa, M.S.,
Surface Sci.,
266 (1992) 110.
[9] Mousa, M.S.
and Kelly, T.F.,
Ultramicroscopy,
95 (2003)
125.
[10] Latham, R.V.
and Salim, M.A.,
J. Phys. E. Sci.
Instrum., 20
(1987) 181.
[11] Knápek, A.,
Sobola, D.,
Burda, D.,
Daňhel, A.,
Mousa, M.S. and
Kolařík, V.,
Nanomaterials, 9
(2019) 1756.
[12]
Saqib, M.,
Jelenc, J.,
Pirker, L.,
Škapin, S.D.,
Pietro, L.D.,
Ramsperger, U.,
Knápek, A.,
Müllerová, I.
and Remškar, M.,
J. Electron
Spectrosc. Relat.
Phenom., 241,
(2020) 146837.
[13] Kaspar, P.,
Sobola, D.,
Částková,
K., Knápek,
A., Burda, D.,
Orudzhev, F.,
Dallaev, R.,
Tofel, P., Trčka,
T., Grmela, L.
and Hadaš,
Z., Polymers, 12
(12) (2020)
2766.
[14] Madanat,
M.A., Mousa,
M.S., Al-Rabadi,
A.N. and
Fischer, A.,
Jordan J. Phys.,
8 (2015) 79.
[15] Mousa,
M.S., Vacuum, 39
(1988) 835.
[16] Braun, E.,
Smith, J.F. and
Sykes, D.E.,
Vacuum, 25
(1975) 425.
[17] Bayliss,
K.H. and Latham,
R.V., Vacuum, 35
(1985) 211.
[18] Al-Qudah,
A.M., Mousa,
M.S. and
Fischer, A., IOP
Conf. Ser.
Mater. Sci.
Eng., 92 (2015)
012021.
[19] Mousa,
M.S., Fischer,
A. and Mussa,
K.O., Jordan J.
Phys., 1 (2012)
21.
[20] Forbes,
R.G., Deane, J.H.,
Hamid, N. and
Sim, H.S., J.
Vac. Sci.
Technol. B, 22
(2004) 1222.
[21] Al-Hussein,
M., de Jeu, W.H.,
Lohmeijer, B.G.G.
and Schubert,
U.S.,
Macromolecules,
38 (2005) 2832.
[22] Forbes,
R.G., Proc. R.
Soc. A., 469
(2013) 20130271.
[23] Allaham,
M.M., Forbes,
R.G., Knápek, A.
and Mousa, M.S.,
J. Elec. Eng.
Slovak, 71
(2020)
37.
[24] Karpowicz,
A. and Surma,
S., Surface
Science, 213
(2-3) (1989)
393.
[25] Alnawasreh,
S.S., Al-Qudah,
A.M., Madanat,
M.A., Bani Ali,
E.S., Almasri,
A.M. and Mousa
M.S., Applied
Microscopy, 46
(4) (2016) 227.
|
